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Bishnu Prasad Das

Bishnu Prasad Das

Associate Professor

bishnu.das@ece.iitr.ac.in
01332-284798
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VLSI Circuit and System Level Designs, Cyber Physical System Designs and FPGA based Designs., Standard Cell library Design, Resilient circuit design, Hardware security, Variability Measurement
From To Designation Organisation
2012 2013 Post Doctoral Researcher CMU, Pittsburgh, USA
2009 2012 Post Doctoral Researcher Kyoto University, Japan
Award Institute Year Awarded
Young Faculty Research Fellowship (YFRF) Ministry of Electronics & Information Technology (MeitY), Government of India 2018
Degree Subject University Year Studied
Ph.D. Electronics Design & Technology IISc, Bangalore 2009
Scheme Sponsoring Agency Other Faculties Year Sponsored
Design and on-chip characterization of standard cell library FIG 2015
Design of Voltage-Scalable and Process Variation Tolerant Standard Cell Library SERB 2016
SMDP C2SD (Chips to Systems Design) MEITY 2015
Membership Details
IEEE Senior Member
Title Course Code Course Semester
Analog VLSI Circuit Design ECN-581 M.Tech., B.Tech IV, Ph.D Autumn
VLSI Physical Design ECN-591 M.Tech., B.Tech IV, Ph.D Spring
Digital System Design ECN-578 M.Tech., B.Tech IV, Ph.D Autumn
IC Application Laboratory ECN-351 B.Tech III Autumn
Digital Electronic Circuits Laboratory ECN-252 B.Tech II Spring
Microelectronic Devices,Technology and Circuits ECN-341 B.Tech III Autumn
Training and Seminar EC-491 B.Tech IV Autumn
DIGITAL LOGIC DESIGN ECN-104 BTech (CSE) Spring
Digital Logic Design ECN-104 BTech (CSE) Spring
Topic Scholar Name Status of PhD Registration Year
Resilient Circuit Design Sannena Govinda A 2014
Sub-threshold Standard Cell Design Priyamvada Sharma A 2014
On-chip Process Variation Measurement Poorvi Jain A 2015
Memory Design Prasanna Kumar Saragada O 2017
DSP architectures Anu Verma O 2018
Soil Sensors Aranya Gupta O 2020
Memory Design Amandeep Singh O 2020
Ultra-low power circuit design Anant Kumar Singh O 2021
PLL Design Anshul Verma O 2019

Patent

P1. Bharadwaj Amrutur and Bishnu Prasad Das, “Gate Delay Measurement Circuit and Method of Determining a Delay of a Logic Gate” US patent No. 8,224,604 B1 and date of Patent July 17, 2012. 

P2. Lawrence Pileggi, Bishnu P. Das, Kaushik Vaidyanathan, “Testing integrated circuits during split fabrication,” Application No: PCT/US2015/012220, Publication no: WO2015160405 A3, Publication date, Dec 10, 2015.



Journal Papers

J11. Priyamvada Sharma and Bishnu Prasad Das, "Design and Analysis of Leakage-Induced False Error Tolerant Error Detecting Latch for Sub/Near-Threshold Applications," in IEEE Transactions on Device and Materials Reliability, vol. 20, no. 2, pp. 366-375, June 2020

J10. Priyamvada Sharma, Poorvi Jain and Bishnu Prasad Das, "An Optimal Device Sizing for a Performance-Driven and Area-Efficient Subthreshold Cell Library for IoT Applications" in Elsevier Microelectronics Journal, Volume 92, 2019, 104613.

J9. Poorvi Jain and Bishnu Prasad Das, "Reducing the Impact of Local Load Variation on the DUT in a Process Detector Using a Supply Controlled Ring Oscillator," in IEEE Transactions on Semiconductor Manufacturing, vol. 32, no. 4, pp. 605-612, Nov. 2019

J8. Poorvi Jain and Bishnu Prasad Das, "On-Chip Threshold Voltage Variability Estimation Using Reconfigurable Ring Oscillator," in IEEE Transactions on Semiconductor Manufacturing, vol. 32, no. 2, pp. 226-235, May 2019.

J7. Govinda Sannena and Bishnu Prasad Das, "Low Overhead Warning Flip-Flop Based on Charge Sharing for Timing Slack Monitoring," in IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 26, no. 7, pp. 1223-1232, July 2018.

J6. Govinda Sannena and Bishnu Prasad Das, "Metastability immune and area efficient error masking flip-flop for timing error resilient designs", in Elsevier Integration, the VLSI Journal Vol. 61, Pages 101-113, March 2018

J5. Bishnu Prasad Das and Hidetoshi Onodera, “Frequency-Independent Warning Detection Sequential for Dynamic Voltage and Frequency Scaling in ASICs,” in IEEE Transactions on Very Large Scale Integration Systems, vol. 22, no. 12, pp. 2535-2548, Dec. 2014.

J4. Bishnu Prasad Das and Hidetoshi Onodera, “On-chip Measurement of Rise/Fall Gate Delay Using Reconfigurable Ring Oscillator,”  IEEE Transactions on Circuits and Systems II, Vol. 61, No. 3, Mar 2014, pp. 183-187.

J3. Bishnu Prasad Das and Hidetoshi Onodera, “Area-Efficient Reconfigurable-Array-Based Oscillator for Standard Cell Characterization,” IET Circuits Devices Syst., Vol. 6, Iss. 6, pp. 429–436, Nov. 2012.

J2. Bishnu Prasad Das, Bharadwaj Amrutur, H.S.Jamadagni, N.V.Arvind, V. Visvanathan, “Voltage and Temperature Aware SSTA Using Neural Network Delay Model,” IEEE Transactions on Semiconductor Manufacturing, vol. 24, No. 4, pp. 533- 544, Nov. 2011.

J1. Bishnu Prasad Das, Bharadwaj Amrutur, H.S.Jamadagni, N.V.Arvind, V. Visvanathan, “Within-Die Gate Delay Variability Measurement using Re-configurable Ring Oscillator,” IEEE Transactions on Semiconductor Manufacturing, Vol. 22, No. 2, pp. 256-267, May 2009.

Conference papers

C17. Poorvi Jain and Bishnu Prasad Das, "On-Chip Threshold Voltage Variability Detector Targeting Supply of Ring Oscillator for Characterizing Local Device Mismatch", Accepted in ICMTS conference 2019 at Kita-kyushu City, Japan

C16. Swaati and Bishnu Prasad Das, " A 10T Subthreshold SRAM Cell with Minimal Bitline Switching for Ultra-low Power Applications", 21st International Symposium on VLSI Design and Test (VDAT), 2017, Roorkee, India.

C15Poorvi Jain and Bishnu Prasad Das, "Within-Die Threshold Voltage Variability Estimation Using Reconfigurable Ring Oscillator", IEEE VLSI Design conference, 2017, Hyderabad, India.

C14. Govinda Sannena and Bishnu Prasad Das, "Area and Power-efficient Timing Error Predictor for Dynamic Voltage and Frequency Scaling Application," IEEE International Symposium on Nanoelectronic and Information Systems (iNIS), December 19-21, 2016, Gwalior, India

C13. Govinda Sannena and Bishnu Prasad Das, "A Metastability Immune Timing Error Masking FlipFlop for Dynamic Variation Tolerance," ACM GLSVLSI, Boston, USA, May, 2016.

C12. Kaushik Vaidyanathan, Bishnu P Das and Larry Pileggi“Detecting Reliability Attacks during Split Fabrication using Test-only BEOL Stack,” IEEE/ACM Design Automation Conference (DAC), June, 2014

C11. Kaushik Vaidyanathan, Bishnu P Das, Ekin Sumbul, Renzhi Liu, Larry Pileggi, “Building trusted ICs using split fabrication,” IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 2014

C10. Bishnu Prasad Das and Hidetoshi Onodera, “Reconfigurable Array-Based Area-Efficient Test Structure for Standard Cell Characterization,” IEEE Twelfth Workshop on RTL and High Level Testing, 2011.

C9. Bishnu Prasad Das and Hidetoshi Onodera, “Warning Prediction Sequential for Transient Error Prevention,” IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems 2010.

C8. Bishnu Prasad Das and Hidetoshi Onodera, “Accurate Individual Gate Delay Measurement to Study Within-die Variations”, IEICE Spring meeting, Sendai, Japan, March 2010

C7. Bishnu Prasad Das, “Delay Variability: Modeling and On-chip Measurement”, PhD Forum, Design Automation & Test in Europe, Nice, France, April, 2009

C6. Bishnu Prasad Das, Bharadwaj Amrutur, H.S.Jamadagni, N.V.Arvind, V. Visvanathan, “Within-Die Gate Delay Variability Measurement using Re-configurable Ring Oscillator”, IEEE Custom Integrated Circuits Conference (CICC), San Jose, USA, September 2008.

C5. Bishnu Prasad Das, Janakiraman V, B Amrutur, H.S. Jamadagni, N.V. Arvind, “Voltage and Temperature Scalable Gate Delay and Slew Models Including Intra-Gate Variations”, IEEE VLSI Design Conference, Hyderabad, India, Jan 2008

C4. Janakiraman V, Bishnu Prasad Das, B Amrutur, “Voltage and temperature scalable standard cell leakage models based on stacks for statistical leakage characterization”, IEEE VLSI Design Conference, Hyderabad, India, Jan 2008.

C3. Bishnu Prasad Das, Bharadwaj Amrutur, H S Jamadagni Voltage scalable statistical gate delay models using neural networks, 11th IEEE VLSI Design And Test Symposium, Kolkota, India, 2007.

C2. Janakiraman, Bishnu Prasad Das, Vish Visvanathan and B. Amrutur, "Leakage modeling of logic gates considering effect of input vectors", 11th IEEE VLSI Design And Test Symposium, Kolkota, India, 2007

C1. Bishnu Prasad Das, Bharadwaj Amrutur, H.S.Jamadagni, “Critical Path Modeling for Dynamic Voltage Scaling (DVS) in Low Power Applications”, 10th IEEE VLSI Design and Test Symposium, Goa, India, 2006.


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